News
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Dry bean tour will give institutional buyers a behind-the-scenes look at Michigan beans
Published on December 5, 2016
Institutional stakeholders will get a first-hand glimpse at the Michigan dry bean supply chain. -
Last chance to receive pesticide recertification credits from the IPM Academy Online
Published on November 2, 2016
Up to five commercial or private core pesticide recertification credits are available for Michigan applicators until Dec. 31, 2016. No registration or fees required. -
Summary of Upper Peninsula field crop production for 2016
Published on October 18, 2016
Michigan’s Upper Peninsula reported adequate field crop yields despite a dry July and wet fall. -
Yield monitor calibration procedure
Published on September 29, 2016
Accurate calibration yields accurate data. Take time to calibrate your yield monitor as you start harvest. -
Collecting accurate yield monitor data
Published on September 29, 2016
There are many benefits from collecting yield data. Take the time to calibrate your monitor properly. -
Northeast Michigan field crop regional report – August 11, 2016
Published on August 11, 2016
A month of above-normal temperatures and almost no measurable precipitation has intensified moisture stress in most crops across northeast Michigan. -
Western bean cutworm peak flight is occurring in dry beans
Published on August 2, 2016
Begin scouting central and northern Michigan dry beans for western bean cutworms. -
Spider mite spraying in Michigan field crops: Brand new cheat sheet
Published on August 1, 2016
We’ve got perfect spider mite conditions due to this summer’s dry weather and the arrival of August. Irrigation can complicate decisions. Here are tips to get any sprays right. -
Central Michigan field crop regional report – July 29, 2016
Published on July 29, 2016
Rains bring some relief from drought-like conditions. -
Northeast Michigan field crop regional report – July 14, 2016
Published on July 14, 2016
Several crops are entering the reproductive stages of development, which are critical for yield.